2021; Vol. 4 No.4: 354–365

DOI: https://doi.org/10.15276/aait.04.2021.5 

Yakovyna V. S., Symets I. I.“Towards a software defect proneness model: feature selection”. Applied Aspects of Information Technology. Publ. Nauka i  Tekhnika. Odessa: Ukraine. 2021; Vol. 4 No. 4: 354– 365. DOI: https://doi.org/10.15276/aait.04.2021.5